ELECTROMIGRATION INDUCED HILLOCK DYNAMICS ON THE INTERCONNECT SURFACE Four Fold Crystal Symmetry, {100} Planes in FCC When the tilt angle becomes 30°, the edge-hillock at
low and moderate electron wind intensities χ= 5−25 dies off gradually, with
minor modification in shape such as small bending to lee side. At high intensities as
illustrated in Figure the Gaussian shape hillock transforms into finger shape
hillock bending towards the leeside. This bend finger shape hillock grows without
any change in form, and shift rather fast towards the cathode edge, if one uses a
high diffusion anisotropy coefficient such as A =10. |
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